Διαγράμματα ελέγχου για υψηλής απόδοσης διεργασίες
Master Thesis
Date
2007-11-01View/
Abstract
High yield production processes that involve a low fraction of non-conforming are becoming more common. In these cases, the fraction of non-conforming is 0.001 and n-np Shewhart control charts are unsatisfactory for monitoring high quality processes. Since they grow many false alarm signals and are not able to detect improvement of the process. In the literature, most charts for monitoring high quality processes are based on the geometric distribution, that is are based on the number of items inspected until one non-conforming item is observed. The aim of this dissertation is to review and present the use of basic charts in these industrial processes (Cumulative Count of Conforming (CCC), Geometric control chart), to establish their characteristics and make comparisons.
Language
GreekCollections
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Αναφορά Δημιουργού-Μη Εμπορική Χρήση-Όχι Παράγωγα Έργα 4.0 Διεθνές
Αναφορά Δημιουργού-Μη Εμπορική Χρήση-Όχι Παράγωγα Έργα 4.0 Διεθνές