Development of electromagnetic (EM) attack platform and evaluation of secure embedded implementations
Ανάπτυξη πλατφόρμας ηλεκτρομαγνητικών (EM) επιθέσεων και αξιολόγηση ασφαλών ενσωματωμένων υλοποιήσεων
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Keywords
EMFI ; Fault injection ; tinyAES ; MCU surface mapping ; Embedded security ; IoT ; EMFI testing methodology ; Automated attack platform ; Fault susceptibility analysisAbstract
With the rapid growth of the Internet of Things (IoT) over the past years we have seen an increased use of embedded devices in a range of different fields from smart homes and medical devices to automotive and industrial applications. Embedded devices have always been part of our lives, from smart cards, like credit cards, Automated Teller Machines (ATMs), and other similar devices that aid in storing information or automating simple processes.
Today, the ecosystem of embedded devices has expanded significantly, covering a wide range of industries and applications. As these devices evolve, they can perform more advanced features, which increases their utilization. This evolution has as a result the increasing incorporation of such devices in our daily lives, in many cases managing critical operations like self-driving cars and healthcare devices. Moreover, the amount of data these devices collect, and their sensitivity, have seen exponential growth.
As we rely more on these technological advances it is of paramount importance to understand the security risks they pose. These new technologies, relying on embedded devices, open a new attack surface, not commonly seen in software applications, related to their hardware components, like their processors. The security of the information these devices collect and store, along with the control over critical functions, is directly dependent on the security of the underlying hardware.
In this thesis, we will present the development and implementation of an Electromagnetic (EM) Attack Platform designed to evaluate the resilience of secure embedded systems against EM interference. Utilizing a methodical approach, we will examine the entire surface of a target microcontroller unit (MCU) to identify and map areas on its surface that are susceptible to EM-induced faults.
We will begin by providing an overview of the hardware equipment we use to create our lab setup, including all the automation procedures we establish to make the platform as efficient and autonomous as possible. Then we will present our case study, including the proposed methodology for this problem. Finally, we will present the results of the experiments we performed using this lab setup and proposed methodology and draw our final conclusions.
Postgraduate Studies Programme
Κυβερνοασφάλεια και Επιστήμη ΔεδομένωνDepartment
Σχολή Τεχνολογιών Πληροφορικής και Επικοινωνιών. Τμήμα ΠληροφορικήςNumber of pages
67Language
EnglishCollections
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Αναφορά Δημιουργού-Μη Εμπορική Χρήση 3.0 Ελλάδα
Αναφορά Δημιουργού-Μη Εμπορική Χρήση 3.0 Ελλάδα